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Design for Test/ Debug (DFT/DFD)

By December 3, 2020June 1st, 2023No Comments

Our team of Design for Testability experts can help increase IC test coverage, yields and quality.

Design for Testing (DFT) and Debugging (DFD) are critical stages in the micro-architectural phase of a design. Working in tandem with a client’s design team, our experts understand the structure of the chip which enables them to create the complete DFT and DFD architecture.

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