|Verification Futures 2018 (click here to see full programme)
|Professor Mark Zwolinski, University of Southampton
|Processor Intrusion Detection
|Single Event Upsets (SEUs), caused by radiation or other environmental effects, can cause a processor to crash or hang, or can cause loss of data. SEUs can also be introduced deliberately in order to expose security weaknesses. In this presentation we will show how an instruction-level simulator can be used to inject faults into a system and how ‘hot-spots’ can be detected and exploited. We will also show how the resulting anomalous behaviour can be detected using existing performance counters within a processor.
- Physical faults can be exploited to create security vulnerabilities.
- Anomalous behaviour can be detected using built-in hardware counters.
- Vulnerabilities can be simulated to identify hot-spots.
|Mark Zwolinski received the B.Sc. degree in electronic engineering and the Ph.D. degree in electronics from University of Southampton, Southampton, U.K., in 1982 and 1986, respectively. He is currently a Professor in the School of Electronics and Computer Science, University of Southampton. He has authored two textbooks and has co-authored a third. He has written over 200 papers in the areas of EDA, reliability and test. He has supervised over 30 PhD students to completion. His current research interests include hardware security, fault tolerance, and behavioural modelling and simulation. Prof. Zwolinski is a Fellow of IET and BCS and Senior Member of IEEE and ACM.