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Hardware Safety Metrics for ISO 26262 Compliance

Conference: DVCLUB Europe | Automotive Safety and ISO26262
Speaker: Sergio Marchese, Technical Marketing Manager, OneSpin Solutions
Abstract: Automotive safety engineers know how hard it is to comply with the requirements of ISO 26262. Safety requirements, in turn, create new tasks for hardware developers. The quantitative analysis of random faults, and their connection to failure modes, safety mechanisms, FMEDA spreadsheets, and other safety analysis techniques is crucial to meet the demands of the target automotive safety integrity level (ASIL).The calculation and verification of key metrics, such as single-point fault metric (SPFM), and diagnostic coverage (DC), get pushed from safety engineers to hardware design and verification teams.But what other metrics, besides SPFM and DC, are relevant in hardware safety? And why should hardware design and verification engineers care about them? This presentation takes a holistic view of hardware safety metrics. It analyzes their differences, merits, and roles in ISO 26262 compliance for specific ASIL targets.
Speaker Biography:

Sergio Marchese is the Technical Marketing Manager at OneSpin Solutions. He brings to this role 18 years of experience in the semiconductor and electronicdesign automation (EDA) industries. Marchese started his career at InfineonTechnologies, applying coverage-driven constrained-random simulation and formal methods to verify the TriCore CPU, an architecture widely used in automotive SoCs.

He has since worked on projects in the communications, consumer, industrial and aerospace domains. Most recently, he served as verification expert at Huawei Technologies, leading formal verification activities for ARM CPU and consumer SoC designs. Marchese has built and managed stateof- the-art teams, successfully signing off complex hardware designs solely using formal verification. Marchese holds a Master of Electronic Engineering degree from University of Catania, Italy. He has presented at several industry conferences in Europe and North America, and has published numerous
technical papers.


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