Catalouged To Match Unique Needs

BERTScope with Clock Recovery


  • Device & Module Transmitter Compliance Test
  • Device & Module Stressed Receiver Sensitivity and/or jitter tolerance testing
  • Signal Integrity of High Speed Communications Systems
  • Design and Verification of Optical Transceivers

Arbitrary Waveform Generator


  • Wideband RF/MW Communications and Defense Electronics
  • Validation and compliance testing of High Speed Silicon & Communication Devices
  • Coherent Optical Research & Development
  • Leading-edge Research in electronics, physics & chemistry

Logic Analyser


  • FPGA
  • Processor and Bus Debug and Verification
  • Signal integrity
  • Digital hardware validation and debug
  • Monitoring, measurement, and optimization of digital hardware performance
  • Embedded software integration, debug, and verification

Vector Network Analyser


  • Frequency range from 9 kHz up to 20 GHz
  • Wide dynamic range of up to 140 dB
  • Short sweep times, e.g. 4 ms for 401 points
  • High temperature stability of typ. 0.01 dB/°C
  • Wide power sweep range of 98 dB
  • Wide range of IF bandwidths from 1 Hz to 10 MHz
  • Manual and automatic calibration
  • Large, high-resolution 12.1″ screen
  • Touchscreen user interface
  • Two or four ports
  • Four-port model with two independent generators
  • Expansion to up to 48 ports using switch matrices

Calibration KIT


  • Mechanical Cal kit

Signal and Spectrum Analyzer


  • Frequency range up to 13.6 GHz
  • Up to 160 MHz signal analysis bandwidth
  • 0.4 dB level measurement uncertainty up to 7 GHz
  • Measurement applications for GSM/EDGE (including EDGE Evolution), WCDMA/HSPA+, LTE, WiMAX™, WLAN, CDMA2000®, 1xEV-DO, vector signal analysis
  • Easy on-site upgrading with options
  • -110 dBc (1 Hz) phase noise at 10 kHz frequency offset
  • +15 dBm third-order intercept (TOI)
  • Displayed average noise level (DANL) in 1 Hz bandwidth: -155 dBm at 1 GHz, -147 dBm at 30 GHz; with R&S®FSV-B24 preamplifier: -162 dBm at 30 GHz
  • Removable hard drive for applications where security is a concern
  • Frequency range up to 110 GHz with the R&S®FSV-B21 option integrated in the R&S®FSV30/40 and the R&S®FS-Z60/-Z75/-Z90/-Z110 harmonics mixers

Pulse Function Arbitrary Noise Generator


  • Automotive busses physical layer receiver test (CAN, LIN, FlexRay, MOST, BroadR Reach)
  • Sensor simulation
  • Clock signal generation
  • Radar distance testing
  • Disc drive tests
  • Noise and jitter source with selectable crest factor
  • Signal source with modulation
  • Pulsed IV measurements
  • System trigger source
  • Capture and reproduce live signals

Audio Analyzer


  • Analog and Digital Audio Analysis
  • Characterize signal-to-noise ratio, SINAD, IMD, DFD, THD+N ratio, THD+N level, crosstalk, and more
  • View numerical and graphical displays of measurement results
  • 2 in 1 screen (generator and analyzer in the same display screen)



  • Bandwidth 16 GHz
  • Channels 4 channels
  • Sample rate 80 GSa/s 2 ch, 40 GSa/s 4 ch
  • Memory depth 20 Mpts standard
  • Up to 2 Gpts available
  • Edge trigger > 20 GHz
  • Mixed signal 20 GSa/s on 8 ch

Automated ESD test system


  • Simultaneous plural zapping is practicable
  • Install maximum of 8 sockets and simultaneous plural zapping into each socket is possible
  • Adaptable to various standard waveform
  • This corresponds with domestic and aboard standard such as JEITA, JEDEC and ESDA standard.
  • Adaptable to Latch-up test
  • Adaptable to ESD pulse method, Vsupply overvoltage method and constant pulse current method.
  • Establishing the diversity of destruction judgment
  • Allows the destruction judgment with DC measurement and providing the function test bu using as option.

CDM Tester


  • High precision to pulsing
  • Discharging waveform is to be confirmed with current detector for every zapping.
  • Adaptable to various standard waveforms
  • This corresponds with domestic and aboard standard such as JEITA, JEDEC and ESDA standard.
  • Capacitance measurement to the device(Option)
  • Capacity of each pin to the device is to be measured. The data can be saved in the text file.

Dynamic Burn-in Oven & Test system


  • Device power supplied by individual
  • Sources per BIB: read current for each source
  • High-power oven dissipation
  • Timing Sets = 32, selectable on-the-fly, cycle to cycle
  • Channels: 256 I/O + 48 Stimulus
  • Total available BIB slots = 4
  • BIB standard : EDA HD-H standard (570 x 440 mm)
  • Maximum frequency for data = 10Mhz
  • Stimulus voltage as low as 0.5V
  • 32M pattern depth
  • 3 separate bias voltage per device