Equipment

Catalouged To Match Unique Needs

BERTScope with Clock Recovery

Tektronix/BSA125C/CR125A

  • Device & Module Transmitter Compliance Test
  • Device & Module Stressed Receiver Sensitivity and/or jitter tolerance testing
  • Signal Integrity of High Speed Communications Systems
  • Design and Verification of Optical Transceivers

Arbitrary Waveform Generator

Tektronix/AWG70002A

  • Wideband RF/MW Communications and Defense Electronics
  • Validation and compliance testing of High Speed Silicon & Communication Devices
  • Coherent Optical Research & Development
  • Leading-edge Research in electronics, physics & chemistry

Logic Analyser

Tektronix/TLA6404

  • FPGA
  • Processor and Bus Debug and Verification
  • Signal integrity
  • Digital hardware validation and debug
  • Monitoring, measurement, and optimization of digital hardware performance
  • Embedded software integration, debug, and verification

Vector Network Analyser

R&S/ZNB20

  • Frequency range from 9 kHz up to 20 GHz
  • Wide dynamic range of up to 140 dB
  • Short sweep times, e.g. 4 ms for 401 points
  • High temperature stability of typ. 0.01 dB/°C
  • Wide power sweep range of 98 dB
  • Wide range of IF bandwidths from 1 Hz to 10 MHz
  • Manual and automatic calibration
  • Large, high-resolution 12.1″ screen
  • Touchscreen user interface
  • Two or four ports
  • Four-port model with two independent generators
  • Expansion to up to 48 ports using switch matrices

Calibration KIT

R&S/ZV-Z235

  • Mechanical Cal kit

Signal and Spectrum Analyzer

R&S/FSV13

  • Frequency range up to 13.6 GHz
  • Up to 160 MHz signal analysis bandwidth
  • 0.4 dB level measurement uncertainty up to 7 GHz
  • Measurement applications for GSM/EDGE (including EDGE Evolution), WCDMA/HSPA+, LTE, WiMAX™, WLAN, CDMA2000®, 1xEV-DO, vector signal analysis
  • Easy on-site upgrading with options
  • -110 dBc (1 Hz) phase noise at 10 kHz frequency offset
  • +15 dBm third-order intercept (TOI)
  • Displayed average noise level (DANL) in 1 Hz bandwidth: -155 dBm at 1 GHz, -147 dBm at 30 GHz; with R&S®FSV-B24 preamplifier: -162 dBm at 30 GHz
  • Removable hard drive for applications where security is a concern
  • Frequency range up to 110 GHz with the R&S®FSV-B21 option integrated in the R&S®FSV30/40 and the R&S®FS-Z60/-Z75/-Z90/-Z110 harmonics mixers

Pulse Function Arbitrary Noise Generator

KEYSIGHT/U81150A

  • Automotive busses physical layer receiver test (CAN, LIN, FlexRay, MOST, BroadR Reach)
  • Sensor simulation
  • Clock signal generation
  • Radar distance testing
  • Disc drive tests
  • Noise and jitter source with selectable crest factor
  • Signal source with modulation
  • Pulsed IV measurements
  • System trigger source
  • Capture and reproduce live signals

Audio Analyzer

KEYSIGHT/U8903A

  • Analog and Digital Audio Analysis
  • Characterize signal-to-noise ratio, SINAD, IMD, DFD, THD+N ratio, THD+N level, crosstalk, and more
  • View numerical and graphical displays of measurement results
  • 2 in 1 screen (generator and analyzer in the same display screen)

Oscilloscope

KEYSIGHT/DSAX91604A

  • Bandwidth 16 GHz
  • Channels 4 channels
  • Sample rate 80 GSa/s 2 ch, 40 GSa/s 4 ch
  • Memory depth 20 Mpts standard
  • Up to 2 Gpts available
  • Edge trigger > 20 GHz
  • Mixed signal 20 GSa/s on 8 ch

Automated ESD test system

HANWA/HED N5000

  • Simultaneous plural zapping is practicable
  • Install maximum of 8 sockets and simultaneous plural zapping into each socket is possible
  • Adaptable to various standard waveform
  • This corresponds with domestic and aboard standard such as JEITA, JEDEC and ESDA standard.
  • Adaptable to Latch-up test
  • Adaptable to ESD pulse method, Vsupply overvoltage method and constant pulse current method.
  • Establishing the diversity of destruction judgment
  • Allows the destruction judgment with DC measurement and providing the function test bu using as option.

CDM Tester

HANWA/HED C5000R

  • High precision to pulsing
  • Discharging waveform is to be confirmed with current detector for every zapping.
  • Adaptable to various standard waveforms
  • This corresponds with domestic and aboard standard such as JEITA, JEDEC and ESDA standard.
  • Capacitance measurement to the device(Option)
  • Capacity of each pin to the device is to be measured. The data can be saved in the text file.

Dynamic Burn-in Oven & Test system

EDA SM12

  • Device power supplied by individual
  • Sources per BIB: read current for each source
  • High-power oven dissipation
  • Timing Sets = 32, selectable on-the-fly, cycle to cycle
  • Channels: 256 I/O + 48 Stimulus
  • Total available BIB slots = 4
  • BIB standard : EDA HD-H standard (570 x 440 mm)
  • Maximum frequency for data = 10Mhz
  • Stimulus voltage as low as 0.5V
  • 32M pattern depth
  • 3 separate bias voltage per device

Decapsulator

The JetEtch decapsulation system takes an integrated circuit encapsulated in mold compound and removes it using a user-specified chemical solution. The process of mold compound removal is called “decapsulation” and is often referred-to as “decapping,” “Jet-Etching”.

Features

  • Patented Pump
  • Robust Heat Exchanger
  • Ease-of-Use
  • Next-generation Technology
  • Thermostream

    Thermo Streams are portable systems that deliver clean dry air for precision temperature testing or conditioning of electronics (ICs, MEMS, transceivers, or circuits) and materials. No other systems can bring your test subjects to temperature faster with precise control.
    With rapid thermal cycling or long saturation at a precise temperature, these systems optimize throughput for characterization, verification, thermal shock or failure analysis applications – at the test bench or on the production floor.

    Features

    • No LN2 or LCO2 required
    • 100 to +300°C
    • Programmable transitions, up to 15°C/sec
    • 1.0°C accuracy
    • Extended reach for easy DUT access
    • Integrated purging system prevents moisture buildup on the DUT

    Bake Oven

    An oven is a thermally insulated chamber used for the baking purpose for removing the moisture from the devices.
    Tailore made to suit wide range of applications where high volume is applicable

    Features

  • Equipment temp range is 50°C to 250°C
  • Temperature can be controlled by Phase angled fired Thyristor
  • K-type thermocouple is provided inside the oven for sensing the temperature.
  • Rotor switch is provided to switch ON/OFF the main control.
  • UV Eraser

    • Indicator light when erasing
    • Power safety switch inside the drawer shuts off unit whenever the drawer is opened
    • Large capacity

    8.5 Digit DMM

    • Maximum sensitivity: 10 nV
    • Programmable integration times from 500 ns to 1 sec
    • Two-source (10 V, 10 kΩ) calibration, including AC
    • Self-adjusting, self-verifying auto-calibration for all functions and ranges, including AC
    • Multimeter Language (ML) compatible

    Pulse Generator

    • High precision pulse generator is enhanced with a versatile signal generator, offering distortion capabilities to stress your device to its limit
    • Arbitrary bit-shaped pattern generator for ideal and distorted pattern up to 120 Mbit/s.
    • Function arbitrary generator provides versatile waveforms and modulation capabilities to adapt the signal to devices requirements
    • Noise generator combines two required extremes: random noise and repeatable noise with very long repetition rates for simple problem identification

    Key Features

    • 1µ – 120 MHz pulse generation with variable rise/fall time
    • 1µ – 240 MHz sine waveform output
    • 14-bit, 2 GSa/s arbitrary waveforms
    • 512k samples deep arbitrary waveform memory per channel
    • Noise with a selectable crest factor and signal repetition time of 26 days
    • FM, AM, PW, PWM, FSK modulation capabilities up to 10 MHz
    • 1 or 2 channel, coupled and uncoupled
    • Differential outputs

    DC Power Supply

    Key Features Performance

    • High performance/power
    • Power efficient switching type power supply
    • Low impact on load devices
    • Fast transient recovery time of 1ms
    • Fast output response time

    Features

    • OVP, OCP and OTP protection
    • Adjustable voltage and current slew rates
    • User adjustable bleeder control to quickly dissipate the power after shutdown to safe levels.
    • Extensive remote monitoring and control options
    • Support for series* and parallel connections. *(30, 80 volt models only)
    • Power on configuration settings.
    • Web server monitoring and control

    Interface

    • Ethernet port
    • Analog connector for analog voltage and current monitoring
    • USB host and device port