The world's fastest and most reliable tester.

Matrix matched embedded system bussed supplies means true high speed curve tracing

Full four wire measurement system for precise V/I measurements and accuracy.Post-stress and pre-stress VI curve test.

 Pre-conditioning , state read-back and full control of each test pin

 Test report including pre-stress, pre-fail (ESD) and post-fail data, as well as full curve trace and specific data point measurements

 Available fixtures for most IC package types

 Quick turn-around time

 CD with softcopies of all test data, curves, and reports

 30V,3A standard

 dual range available

 100V/1A, 30V/5A

 100V/1A, 10V/5A

 30V/5A, 10V/10A

 64k Vectors/pin

 10Mhz vector rate from an internal clock gets DUT quickly into the state necessary for testing.

 Full DUT state verification (hardware implemented) Vector importing feature

 Full control of the test pin 

 Ability to test any vectored pin

 Stress generator "parks" at the last vector state

 HBM

 ESDA ESD STM 5.1

 JEDEC EIA/JESD22 - A114

 AEC Q100 - 002 

 ESDA ESD STM 5.2

 JEDEC EIA/JESD22 - A115

 Q100 - 003

 Latch Up

 JEDEC EIA / JESD78

 AEC Q100 - 004

 Up to 8 devices simultaneously zapped sequential high speed curve tracing dramatically throughput.

 Built -in multiple ESD pulse sources eliminates the requirement for changing discharge heads between tests , and therefore , reduces set - up times.

 For JEDEC , ESDA , and MIL allow common tests to be started quickly with a minimum of programming time.

 Each pin can be independently programmed for unique failure criteria.