..:: Welcome To Tessolve ::..

LTX Fusion HF

	LTX Fusion provides a complete test umbrella to cover all your requirements and applications. And thanks to Fusion's modular architecture, you can buy exactly the test capability you need. LTX offers a board range of test configurations for ICs ranging from VLSI digital to systems-on- a -chip. Currently available configurations include.
	Features
	Total integration of high performance digital and extensive mixed signal test technology. Tester-per-pin architecture Configurable from 64 to 1024 digital pins in 64-pin increments One or two HF ("High Functionality") test heads Advanced Hiper IITM pin electronics (Digital Pin Electronics) enVision++TM software, which combines the enVisionTM operating system with Cadence, LTX's procedural test language for custom test method development.
	Configuration
	512 digital and 16 analog pins 250MHz non multiplexed digital data rate Vector memory of 16M Sequenced Measure Systems (SMS) - Used for complex analog waveform generation and measurement. 2 HR (Hi-res) - Resolution: 16bits (measure), 18bits (source) 4 HS+ (Hi-speed) - Resolution: 14bits (source), 14bits (measure at 65Ms/s), 10bits (measure at 100Ms/s) Continuous Power Sources (CPS) - quad rail 16 channels 8V, 5A Device Power Sources (DPS) - 2nos. 100V, 1A (Central Time Measurement Unit) CTMU - precision measurement with 30ps accuracy and high bandwidth measurement of 800 MHz DPRO - DSP Send and Octal DSP Capture for 128 pins