The IDS 10000cs provides unmatched performance capabilities

 It is the only system to offer unassisted wafer-levelprobing via the Motorized Wafer Stage.

 Near-the-line automated e-beam wafer probe for characterization

 Automated wafer die-to-die step and measure capability for unattended operation, higher throughput and lower cost of operation

 Fast, non-contact, non-loading probe using e-beam techniques to measure thousands of waveforms a day

 Seventh generation high resolution e-beam column for imaging and accurate probe placement to ICs fabricated with 0.18 micron technology

 Unmatched performance with bandwidth of 12GHz, accuracy of +/- 40ps and timing resolution of 2.5ps

 50 megahertz x16 Channels of digital I/O (scalable to 64 channels)

The result is faster IC production cycles and high yield improvements for meeting rigorous time-to-market demands

The IDS 10000cs is ideally suited to IC manufacturers who invest in electrical analysis for process ramp. Initial electrical analysis can save precious time-to-market demands when dealing with advanced semiconductor products