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   TERADYNE Catalyst Test system

Features

 100 Mhz, 80 digital channels

 2 VHF Dig, VHFAWG400A

 VHFAWG400A Differential CC

 U wave6000 Modulated

 Fully integrated analog and digital instrumentation

 Mixed-signal/SOC digital with data rates to 400 Mbps

 Full Spectrum AC instrumentation

 Catalyst's parallel computer architecture reduces overall test time

 IMAGE™ programming system with interactive debug displays and complete test engineering tools for device characterization

 System architecture that accelerates test development and high-volume production for ICs with complex digital, embedded memory, and high-performance analog components